Analysis of uniaxial and biaxial strain impact on the linearity of fully depleted SOI nMOSFETs

✍ Scribed by Marcelo Antonio Pavanello; João Antonio Martino; Eddy Simoen; Cor Claeys

• Book ID: 108271599
• Publisher: Elsevier Science
• Year: 2007
• Tongue: English
• Weight: 263 KB
• Volume: 51
• Category: Article
• ISSN: 0038-1101
• DOI: 10.1016/j.sse.2007.07.016