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The fabrication and the reliability of poly-Si MOSFETs using ultra-thin high-K/metal-gate stack

โœ Scribed by Lee, M.H.; Chen, K.-J.


Book ID
119373502
Publisher
Elsevier Science
Year
2013
Tongue
English
Weight
863 KB
Volume
79
Category
Article
ISSN
0038-1101

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