✦ LIBER ✦

The equivalence of displacement damage in silicon bipolar junction transistors

✍ Scribed by Chaoming Liu; Xingji Li; Hongbin Geng; Erming Rui; Lixin Guo; Jianqun Yang; Liyi Xiao

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Spice modeling of neutron displacement d

✍ Yanqing Deng, ; Fjeldly, T.A.; Ytterdal, T.; Shur, M.S. 📂 Article 📅 2003 🏛 IEEE 🌐 English ⚖ 301 KB

Dynamic high-current stressing damage an

✍ S.-L. Jang; S.-S. Liu; C.-J. Tsai 📂 Article 📅 1995 🏛 Elsevier Science 🌐 English ⚖ 746 KB

Measurement of hybrid-π equivalent circu

✍ Phang, C.H.; Yeow, Y.T.; Barham, R.A.; Allen, P.J. 📂 Article 📅 1997 🏛 IEEE 🌐 English ⚖ 154 KB

From Displacement Damage to ELDRS: Fifty

✍ Galloway, K. F.; Pease, R. L.; Schrimpf, R. D.; Emily, D. W. 📂 Article 📅 2013 🏛 IEEE 🌐 English ⚖ 328 KB

The frequency limits of bipolar junction

✍ Saleh, N. 📂 Article 📅 1975 🏛 John Wiley and Sons 🌐 English ⚖ 190 KB

Origin of large-amplitude random telegra

✍ Pogany, D.; Chantre, A.; Chroboczek, J. A.; Ghibaudo, G. 📂 Article 📅 1996 🏛 American Institute of Physics 🌐 English ⚖ 372 KB