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Spice modeling of neutron displacement damage and annealing effects in bipolar junction transistors

✍ Scribed by Yanqing Deng, ; Fjeldly, T.A.; Ytterdal, T.; Shur, M.S.

Book ID: 120079675
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 301 KB
Volume: 50
Category: Article
ISSN: 0018-9499
DOI: 10.1109/TNS.2003.821391

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