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Spice modeling of neutron displacement damage and annealing effects in bipolar junction transistors

โœ Scribed by Yanqing Deng, ; Fjeldly, T.A.; Ytterdal, T.; Shur, M.S.


Book ID
120079675
Publisher
IEEE
Year
2003
Tongue
English
Weight
301 KB
Volume
50
Category
Article
ISSN
0018-9499

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