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SPICE modelling of impact ionisation effects in silicon bipolar transistors

โœ Scribed by Verzellesi, G.; Dal Fabbro, A.; Pavan, P.; Vendrame, L.; Zabotto, E.; Zanini, A.; Chantre, A.; Zanoni, E.


Book ID
114447514
Publisher
The Institution of Electrical Engineers
Year
1996
Tongue
English
Weight
944 KB
Volume
143
Category
Article
ISSN
1350-2409

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