Measurement of hybrid-π equivalent circuit parameters of bipolar junction transistors in undergraduate laboratories

✍ Scribed by Phang, C.H.; Yeow, Y.T.; Barham, R.A.; Allen, P.J.

• Book ID: 114532517
• Publisher: IEEE
• Year: 1997
• Tongue: English
• Weight: 154 KB
• Volume: 40
• Category: Article
• ISSN: 0018-9359
• DOI: 10.1109/13.618032