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The effects of dwell time on focused ion beam machining of silicon

✍ Scribed by Sabouri, A.; Anthony, C.J.; Bowen, J.; Vishnyakov, V.; Prewett, P.D.


Book ID
122261387
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
555 KB
Volume
121
Category
Article
ISSN
0167-9317

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