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Focused ion beam scan routine, dwell time and dose optimizations for submicrometre period planar photonic crystal components and stamps in silicon

✍ Scribed by Hopman, Wico C L; Ay, Feridun; Hu, Wenbin; Gadgil, Vishwas J; Kuipers, Laurens; Pollnau, Markus; Ridder, René M de


Book ID
121468598
Publisher
Institute of Physics
Year
2007
Tongue
English
Weight
1006 KB
Volume
18
Category
Article
ISSN
0957-4484

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