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The effect of the elevated source/drain doping profile on performance and reliability of deep submicron MOSFETs

✍ Scribed by Sun, J.J.; Bartholomew, R.F.; Bellur, K.; Srivastava, A.; Osburn, C.M.; Masnari, N.A.


Book ID
114536948
Publisher
IEEE
Year
1997
Tongue
English
Weight
204 KB
Volume
44
Category
Article
ISSN
0018-9383

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