๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The effects of source/drain resistance on deep submicrometer device performance

โœ Scribed by Jeng, M.-C.; Chung, J.E.; Ko, P.-K.; Hu, C.


Book ID
114536980
Publisher
IEEE
Year
1990
Tongue
English
Weight
317 KB
Volume
37
Category
Article
ISSN
0018-9383

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES