Impact of the gate-drain overlapped device (GOLD) for deep submicrometer VLSI

✍ Scribed by Izawa, R.; Kure, T.; Takeda, E.

• Book ID: 114538341
• Publisher: IEEE
• Year: 1988
• Tongue: English
• Weight: 505 KB
• Volume: 35
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/16.8781