Indium tin oxide (ITO) thin film prepared by rf sputtering at various Ar-O 2 mixtures, were annealed at several temperatures. The electrical, optical and structural properties of the film were systematically investigated before and after post-thermal treatment. The influence of a reactive gas (O 2 )
β¦ LIBER β¦
The effect of target erosion and RF substrate biasing on the properties of reactively sputtered ITO films
β Scribed by J.N. Avaritsiotis; D.K. Sivridis; E. Roditi
- Publisher
- Elsevier Science
- Year
- 1987
- Weight
- 393 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0165-1633
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We have fabricated ITO-ZnO composition spread films to investigate the effects of substrate temperature on their electrical and optical properties by using combinatorial RF magnetron sputtering. It turned out by X-ray measurement that the film with zinc contents above 16.0 at% [Zn/(In+Zn+Sn)] showed