๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

The effect of pre-aging on the electromigration of flip-chip SnAg solder joints

โœ Scribed by Po-Chun Yang; Chien-Chih Kuo; Chih Chen


Book ID
107523304
Publisher
The Minerals, Metals & Materials Society
Year
2008
Tongue
English
Weight
688 KB
Volume
60
Category
Article
ISSN
1047-4838

No coin nor oath required. For personal study only.


๐Ÿ“œ SIMILAR VOLUMES