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Effect of surface finish on the failure mechanisms of flip-chip solder joints under electromigration

โœ Scribed by Y. L. Lin; Y. S. Lai; C. M. Tsai; C. R. Kao


Book ID
107453833
Publisher
Springer US
Year
2006
Tongue
English
Weight
374 KB
Volume
35
Category
Article
ISSN
0361-5235

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