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The effect of hydrogen on trap generation, positive charge trapping, and time-dependent dielectric breakdown of gate oxides

✍ Scribed by Y. Nissan-cohen; T. Gorczyca

Book ID: 126747993
Publisher: IEEE
Year: 1988
Tongue: English
Weight: 318 KB
Volume: 9
Category: Article
ISSN: 0741-3106
DOI: 10.1109/55.719

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