๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

On the Connection between Dielectric Breakdown Strength, Trapping of Charge, and Contact Angle Saturation in Electrowetting

โœ Scribed by Drygiannakis, Antonis I.; Papathanasiou, Athanasios G.; Boudouvis, Andreas G.


Book ID
120495951
Publisher
American Chemical Society
Year
2009
Tongue
English
Weight
748 KB
Volume
25
Category
Article
ISSN
0743-7463

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