On the different time dependence of interface trap generation and charge trapping during hot carrier degradation in CMOS

✍ Scribed by R. Bellens; G. Groeseneken; P. Heremans; H.E. Maes

• Publisher: Elsevier Science
• Year: 1992
• Tongue: English
• Weight: 224 KB
• Volume: 19
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/0167-9317(92)90475-7