𝔖 Bobbio Scriptorium
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5364. The effects of water on oxide and interface trapped charge generation in thermal SiO2 films: F J Feigl et al, J Appl Phys, 52 (9), 1981, 5665–5682


Publisher
Elsevier Science
Year
1982
Tongue
English
Weight
147 KB
Volume
32
Category
Article
ISSN
0042-207X

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