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The effect of argon during the plasma-assisted chemical vapor deposition of TiN

โœ Scribed by M.R. Hilton; M. Salmeron; G.A. Somorjai


Publisher
Elsevier Science
Year
1988
Tongue
English
Weight
282 KB
Volume
167
Category
Article
ISSN
0040-6090

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We have investi ated the effects of reactant residence time on the properties of microwav+a88isted CV % diamond films. Using a constant process pressure of 40 Torr and gas composition of 1% CHb in Hr? the total gas flow rate was adjusted from 25 to 800 seem. For OUT reactor, this correspond8 to res