✦ LIBER ✦

The damage-dependent atom and carrier profiles in phosphorus-implanted silicon

✍ Scribed by Mikołaj Kisielewicz

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Details of the damage profile in self-io

✍ P. X. Zhang; I. V. Mitchell; P. J. Schultz; D. J. Lockwood 📂 Article 📅 1994 🏛 John Wiley and Sons 🌐 English ⚖ 570 KB

Computer simulated and channelling studi

✍ H Budinov; DS Karpuzov 📂 Article 📅 1988 🏛 Elsevier Science 🌐 English ⚖ 251 KB

Experimental method for measuring both a

✍ Masaya Iwaki; Kenji Gamo; Kohzo Masuda; Susumu Namba; Shinji Ishihara; Itsuro Ki 📂 Article 📅 1975 🏛 Elsevier Science ⚖ 436 KB

Ranges, straggling and carrier concentra

✍ Wu Yuguang; Zhang Huixing; Zhang Xiaoji; Luo Yan; Zhang Tonghe; Han Zhuen 📂 Article 📅 1990 🏛 Elsevier Science 🌐 English ⚖ 400 KB

Determination of the radiation damage in

✍ Miko⧸aj Kisielewicz; Christoph Wagner 📂 Article 📅 1981 🏛 Elsevier Science 🌐 English ⚖ 338 KB

Crystal damage and the properties of imp

✍ P. Zandveld 📂 Article 📅 1978 🏛 Elsevier Science 🌐 English ⚖ 707 KB