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The Correlation of Surface Defects and Reverse Breakdown of 4H-SiC Schottky Barrier Diodes

โœ Scribed by Kung-Yen Lee; Michael A. Capano


Book ID
107453588
Publisher
Springer US
Year
2007
Tongue
English
Weight
338 KB
Volume
36
Category
Article
ISSN
0361-5235

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