✦ LIBER ✦
Establishing the cause of poor device quality in Schottky barrier diodes fabricated on bulk n-type 6H-SiC
✍ Scribed by E. van Wyk; A. W. R. Leitch
- Publisher
- John Wiley and Sons
- Year
- 2004
- Tongue
- English
- Weight
- 123 KB
- Volume
- 1
- Category
- Article
- ISSN
- 1862-6351
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