Testing and Testable Design of High-Density Random-Access Memories

✍ Scribed by Pinaki Mazumder, Kanad Chakraborty (auth.)

Publisher: Springer US
Year: 1996
Tongue: English
Leaves: 413
Series: Frontiers in Electronic Testing 6
Category: Library

No coin nor oath required. For personal study only.

✦ Table of Contents

Content:
Front Matter....Pages i-xxxviii
Introduction....Pages 1-44
Electrical Testing of Faults....Pages 45-73
Functional Fault Modeling and Testing....Pages 75-156
Technology and Layout-Related Testing....Pages 157-219
Built-in Self-Testing and Design for Testability....Pages 221-338
Conclusion....Pages 339-341
Back Matter....Pages 343-386

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