Logic testing and design for testability

📁 Logic testing and design for testability

✍ Hideo Fujiwara 📂 Library 📅 1990 🏛 The MIT Press 🌐 English

Today's computers must perform with increasing reliability, which in turn depends on the problem of determining whether a circuit has been manufactured properly or behaves correctly. However, the greater circuit density of VLSI circuits and systems has made testing more difficult and costly. This bo

VLSI Test Principles and Architectures:

📁 VLSI Test Principles and Architectures: Design for Testability

✍ Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 📂 Library 📅 2006 🏛 Morgan Kaufmann 🌐 English

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Г‚В· Most up-to-date coverag

VLSI Test Principles and Architectures:

📁 VLSI Test Principles and Architectures: Design for Testability

✍ Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 📂 Library 📅 2006 🏛 Morgan Kaufmann 🌐 English

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. Â· Most up-to-date coverage

Test and Design-for-Testability in Mixed

📁 Test and Design-for-Testability in Mixed-Signal Integrated Circuits

✍ José L. Huertas (auth.), José L. Huertas (eds.) 📂 Library 📅 2004 🏛 Springer US 🌐 English

<p><P><STRONG>Test and Design-for-Testability in Mixed-Signal Integrated Circuits</STRONG> deals with test and design for test of analog and mixed-signal integrated circuits. Especially in System-on-Chip (SoC), where different technologies are intertwined (analog, digital, sensors, RF); test is beco

VLSI Test Principles and Architectures:

📁 VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon)

✍ Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen 📂 Library 📅 2006 🌐 English

This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ?· Most up-to-date coverage of

System-on-Chip Test Architectures. Nanom

📁 System-on-Chip Test Architectures. Nanometer Design for Testability

✍ Laung-Terng Wang, Charles E. Stroud and Nur A. Touba (Eds.) 📂 Library 📅 2008 🏛 Morgan Kaufmann 🌐 English