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๐Ÿ“

System-on-Chip Test Architectures. Nanometer Design for Testability

โœ Scribed by Laung-Terng Wang, Charles E. Stroud and Nur A. Touba (Eds.)


Publisher
Morgan Kaufmann
Year
2008
Tongue
English
Leaves
862
Category
Library

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โœฆ Table of Contents


Content:
Preface, Pages xxi-xxvi
In the Classroom, Page xxvii
Acknowledgments, Pages xxix-xxx
Contributors, Pages xxxi-xxxiii
About the Editors, Pages xxxv-xxxvi
Chapter 1 - Introduction, Pages 1-40, Laung-Terng (L.-T.) Wang, Charles E. Stroud, Nur A. Touba
Chapter 2 - Digital Test Architectures, Pages 41-121, Laung-Terng (L.-T.) Wang
Chapter 3 - Fault-Tolerant Design, Pages 123-170, Nur A. Touba
Chapter 4 - System/Network-On-Chip Test Architectures, Pages 171-224, Chunsheng Liu, Krishnendu Chakrabarty, Wen-Ben Jone
Chapter 5 - SIP Test Architectures, Pages 225-261, Philippe Cauvet, Michel Renovell, Serge Bernard
Chapter 6 - Delay Testing, Pages 263-306, Duncan M. (Hank) Walker, Michael S. Hsiao
Chapter 7 - Low-Power Testing, Pages 307-350, Patrick Girard, Xiaoqing Wen, Nur A. Touba
Chapter 8 - Coping with Physical Failures, Soft Errors, and Reliability Issues, Pages 351-422, Laung-Terng (L.-T.) Wang, Mehrdad Nourani, T.M. Mak
Chapter 9 - Design for Manufacturability and Yield, Pages 423-461, Robert C. Aitken
CHAPTER 10 - Design for Debug and Diagnosis, Pages 463-504, T.M. Mak, Srikanth Venkataraman
CHAPTER 11 - Software-Based Self-Testing, Pages 505-548, Jiun-Lang Huang, Kwang-Ting (Tim)
Chapter 12 - Field Programmable Gate Array Testing, Pages 549-590, Charles E. Stroud
Chapter 13 - MEMS Testing, Pages 591-651, Ramesh Ramadoss, Robert Dean, Xingguo Xiong
Chapter 14 - High-Speed I/O Interfaces, Pages 653-701, Mike Peng Li, T.M. Mak, Kwang-Ting (Tim) Cheng
Chapter 15 - Analog and Mixed-Signal Test Architectures, Pages 703-743, F. Foster Dai, Charles E. Stroud
Chapter 16 - RF Testing, Pages 745-789, Soumendu Bhattacharya, Abhijit Chatterjee
Chapter 17 - Testing Aspects of Nanotechnology Trends, Pages 791-831, Mehdi B. Tahoori, Niraj K. Jha, R. Iris Bahar
Index, Pages 833-856


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