This book is the more system oriented variation and addition to VLSI Test Principles and Architectures: Design for Testability (Systems on Silicon) published earlier by L.T. Wang.You get the most complete and up-to-date summary of DfT methodes and techniques. I am using the book at work and for teac
System-on-Chip Test Architectures. Nanometer Design for Testability
โ Scribed by Laung-Terng Wang, Charles E. Stroud and Nur A. Touba (Eds.)
- Publisher
- Morgan Kaufmann
- Year
- 2008
- Tongue
- English
- Leaves
- 862
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Table of Contents
Content:
Preface, Pages xxi-xxvi
In the Classroom, Page xxvii
Acknowledgments, Pages xxix-xxx
Contributors, Pages xxxi-xxxiii
About the Editors, Pages xxxv-xxxvi
Chapter 1 - Introduction, Pages 1-40, Laung-Terng (L.-T.) Wang, Charles E. Stroud, Nur A. Touba
Chapter 2 - Digital Test Architectures, Pages 41-121, Laung-Terng (L.-T.) Wang
Chapter 3 - Fault-Tolerant Design, Pages 123-170, Nur A. Touba
Chapter 4 - System/Network-On-Chip Test Architectures, Pages 171-224, Chunsheng Liu, Krishnendu Chakrabarty, Wen-Ben Jone
Chapter 5 - SIP Test Architectures, Pages 225-261, Philippe Cauvet, Michel Renovell, Serge Bernard
Chapter 6 - Delay Testing, Pages 263-306, Duncan M. (Hank) Walker, Michael S. Hsiao
Chapter 7 - Low-Power Testing, Pages 307-350, Patrick Girard, Xiaoqing Wen, Nur A. Touba
Chapter 8 - Coping with Physical Failures, Soft Errors, and Reliability Issues, Pages 351-422, Laung-Terng (L.-T.) Wang, Mehrdad Nourani, T.M. Mak
Chapter 9 - Design for Manufacturability and Yield, Pages 423-461, Robert C. Aitken
CHAPTER 10 - Design for Debug and Diagnosis, Pages 463-504, T.M. Mak, Srikanth Venkataraman
CHAPTER 11 - Software-Based Self-Testing, Pages 505-548, Jiun-Lang Huang, Kwang-Ting (Tim)
Chapter 12 - Field Programmable Gate Array Testing, Pages 549-590, Charles E. Stroud
Chapter 13 - MEMS Testing, Pages 591-651, Ramesh Ramadoss, Robert Dean, Xingguo Xiong
Chapter 14 - High-Speed I/O Interfaces, Pages 653-701, Mike Peng Li, T.M. Mak, Kwang-Ting (Tim) Cheng
Chapter 15 - Analog and Mixed-Signal Test Architectures, Pages 703-743, F. Foster Dai, Charles E. Stroud
Chapter 16 - RF Testing, Pages 745-789, Soumendu Bhattacharya, Abhijit Chatterjee
Chapter 17 - Testing Aspects of Nanotechnology Trends, Pages 791-831, Mehdi B. Tahoori, Niraj K. Jha, R. Iris Bahar
Index, Pages 833-856
๐ SIMILAR VOLUMES
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ?ยท Most up-to-date coverage of
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ะโะยท Most up-to-date coverag
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. รยท Most up-to-date coverage
<p>Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.</p><p><b>Design and Test Technology for Dependable Systems-on-Chip</b> covers aspects of system de
Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences. This book covers aspects of system design and efficient modelling, and also introduces various fault