Design and Test Technology for Dependable Systems-on-Chip

✍ Scribed by Raimund Ubar, Raimund Ubar, Jaan Raik, Heinrich Theodor Vierhaus

Publisher: IGI Global
Year: 2010
Tongue: English
Leaves: 579
Series: Premier Reference Source
Edition: 1
Category: Library

No coin nor oath required. For personal study only.

✦ Synopsis

Designing reliable and dependable embedded systems has become increasingly important as the failure of these systems in an automotive, aerospace or nuclear application can have serious consequences.

Design and Test Technology for Dependable Systems-on-Chip covers aspects of system design and efficient modelling, and also introduces various fault models and fault mechanisms associated with digital circuits integrated into System on Chip (SoC), Multi-Processor System-on Chip (MPSoC) or Network on Chip (NoC). This book provides insight into refined ''classical'' design and test topics and solutions for IC test technology and fault-tolerant systems.

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