This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. รยท Most up-to-date coverage
VLSI Test Principles and Architectures: Design for Testability
โ Scribed by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen
- Publisher
- Morgan Kaufmann
- Year
- 2006
- Tongue
- English
- Leaves
- 809
- Series
- Systems on Silicon
- Edition
- 1
- Category
- Library
No coin nor oath required. For personal study only.
โฆ Synopsis
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ะโะยท Most up-to-date coverage of design for testability. ะโะยท Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. ะโะยท Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. ะโะยท Lecture slides and exercise solutions for all chapters are now available. ะโะยท Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.
๐ SIMILAR VOLUMES
This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ?ยท Most up-to-date coverage of