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๐Ÿ“

VLSI Test Principles and Architectures: Design for Testability

โœ Scribed by Laung-Terng Wang, Cheng-Wen Wu, Xiaoqing Wen


Publisher
Morgan Kaufmann
Year
2006
Tongue
English
Leaves
809
Series
Systems on Silicon
Edition
1
Category
Library

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โœฆ Synopsis


This book is a comprehensive guide to new DFT methods that will show the readers how to design a testable and quality product, drive down test cost, improve product quality and yield, and speed up time-to-market and time-to-volume. ะ“โ€šะ’ยท Most up-to-date coverage of design for testability. ะ“โ€šะ’ยท Coverage of industry practices commonly found in commercial DFT tools but not discussed in other books. ะ“โ€šะ’ยท Numerous, practical examples in each chapter illustrating basic VLSI test principles and DFT architectures. ะ“โ€šะ’ยท Lecture slides and exercise solutions for all chapters are now available. ะ“โ€šะ’ยท Instructors are also eligible for downloading PPT slide files and MSWORD solutions files from the manual website.


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