High performance memory testing: design
โ R. Dean Adams
๐ Library
๐
2003
๐ Springer
๐ English
โฆ LIBER โฆ
๐
High Performance Memory Testing: Design Principles, Fault Modeling and Self-Test
โ Scribed by R. Dean Adams
- Publisher
- Springer
- Year
- 2002
- Tongue
- English
- Leaves
- 268
- Series
- Frontiers in Electronic Testing
- Edition
- 1
- Category
- Library
โฌ Acquire This Volume
No coin nor oath required. For personal study only.
โฆ Synopsis
Based on the author's 20 years of experience in memory design, memory reliability development and memory test. Written for the professional and the researcher to help them understand the memories that are being tested.
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