✦ LIBER ✦

Test set compaction algorithms for combinational circuits

✍ Scribed by Hamzaoglu, I.; Patel, J.H.

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Forecasting the efficiency of test gener

✍ Shiyi Xu; Tukwasibwe Justaf Frank 📂 Article 📅 2000 🏛 Springer 🌐 English ⚖ 918 KB

Complete test-set generation for bridgin

✍ Sanjoy Kumar Basu; Jogesh Chandra Paul; Pramode Ranjan Bhattacharjee 📂 Article 📅 1986 🏛 Elsevier Science 🌐 English ⚖ 588 KB

Efficient test compaction for combinatio

✍ El-Maleh, A.; Khursheed, S. 📂 Article 📅 2007 🏛 The Institution of Engineering and Technology 🌐 English ⚖ 102 KB

Test generation for cyclic combinational

✍ Raghunathan, A.; Ashar, P.; Malik, S. 📂 Article 📅 1995 🏛 IEEE 🌐 English ⚖ 759 KB

Test compaction for sequential circuits

✍ Niermann, T.M.; Roy, R.K.; Patel, J.H.; Abraham, J.A. 📂 Article 📅 1992 🏛 IEEE 🌐 English ⚖ 766 KB

Test Set and Fault Partitioning Techniqu

✍ Michael S. Hsiao; Srimat Chakradhar 📂 Article 📅 2000 🏛 Springer US 🌐 English ⚖ 74 KB