Efficient test compaction for combinational circuits based on Fault detection count-directed clustering

✍ Scribed by El-Maleh, A.; Khursheed, S.

• Book ID: 117810007
• Publisher: The Institution of Engineering and Technology
• Year: 2007
• Tongue: English
• Weight: 102 KB
• Volume: 1
• Category: Article
• ISSN: 1751-8601
• DOI: 10.1049/iet-cdt:20070004