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TEM Study of the Molecular Effect in Phosphorus Implanted Silicon

โœ Scribed by Shi, T. S. ;De Veirman, A. ;Van Landuyt, J. ;Yang, G. Q. ;Lin, C. L.


Publisher
John Wiley and Sons
Year
1990
Tongue
English
Weight
190 KB
Volume
120
Category
Article
ISSN
0031-8965

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