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TEM characterization of the interface quality of MOVPE grown strained InGaAs/GaAs heterostructures

✍ Scribed by Höpner, A. ;Seitz, H. ;Rechenberg, I. ;Bugge, F. ;Procop, M. ;Scheerschmidt, K. ;Queisser, H. J.

Publisher
John Wiley and Sons
Year
1995
Tongue
English
Weight
980 KB
Volume
150
Category
Article
ISSN
0031-8965

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