Suppression of Cu agglomeration in the Cu/Ta/Si structure by capping layer

✍ Scribed by J.-W. Lim; K. Mimura; M. Isshiki

• Publisher: Institute of Physics and National Institute of Materials Science
• Year: 2003
• Tongue: English
• Weight: 336 KB
• Volume: 4
• Category: Article
• ISSN: 1468-6996
• DOI: 10.1016/s1468-6996(03)00067-6

✦ Synopsis

Cu/Ta/Si (100) structures deposited by the non-mass separated ion beam deposition system showed a slight resistivity increase at 650 8C due to a Cu agglomeration. To suppress the Cu agglomeration on the Ta layer, a capping layer was deposited on the Cu/Ta/Si structure using Ta or SiO 2 as a suppressor. In the case of the Ta suppressor, the agglomeration of Cu was observed between two distorted Ta films due to the difference in thermal expansion between the Cu film and the Ta film at high temperature. On the other hand, the SiO 2 layer was found to be suitable as a suppressor, and the Cu agglomeration did not occur even after annealing at 650 8C by the suppression of the Cu diffusion.