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Ion beam mixing of an embedded Ta marker layer in Si induced by Al3, Cu2 and Ge2 clusters

✍ Scribed by Ping Shi; Fu-Rong Ding; Yao Wang; Rui Nie; Hong-Ji Ma


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
177 KB
Volume
251
Category
Article
ISSN
0168-583X

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