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Subthreshold performance of gate engineered FinFET devices and circuit with high-k dielectrics

✍ Scribed by Nirmal, D.; Vijayakumar, P.; Thomas, Divya Mary; Jebalin, Binola K.; Mohankumar, N.

Book ID: 122749490
Publisher: Elsevier Science
Year: 2013
Tongue: English
Weight: 855 KB
Volume: 53
Category: Article
ISSN: 0026-2714
DOI: 10.1016/j.microrel.2012.09.008

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