✦ LIBER ✦

Study of ZrO2 Film Evolution by Secondary Ion Mass Spectrometry

✍ Scribed by S. Daolio; J. Kristóf; C. Piccirillo; S. Gelosi; B. Facchin; C. Pagura

Publisher: John Wiley and Sons
Year: 1996
Tongue: English
Weight: 461 KB
Volume: 10
Category: Article
ISSN: 0951-4198
DOI: 10.1002/(sici)1097-0231(199611)10:14<1769::aid-rcm691>3.0.co;2-a

No coin nor oath required. For personal study only.

✦ Synopsis

The formation of thermally prepared ZrO, thin films on nickel and titanium supports from a hydrated ZrOCI, precursor was followed as a function of the calcination temperature by secondary ion mass spectrometry.

Concentration depth profiles of selected species (e.g. 0 -, CI-, ZrO;, C,H;) were used to foilow the process of film evolution. Although no reaction between the coating and support takes place, the zirconia films show ditrerences in the distribution of main and trace components in the films as well as in the nature of the coatingsupport interface. The results are in agreement with those of former thennoanalytical and evolved gas analysis studies.

📜 SIMILAR VOLUMES

Characterization of adsorbed protein fil

Characterization of adsorbed protein films by time of flight secondary ion mass spectrometry

✍ Lhoest, J.-B. ;Wagner, M. S. ;Tidwell, C. D. ;Castner, David G. 📂 Article 📅 2001 🏛 John Wiley and Sons 🌐 English ⚖ 254 KB 👁 1 views

Hydrogen outgassing of ZrNiCu(H) amorpho

Hydrogen outgassing of ZrNiCu(H) amorphous alloy studied by secondary ion mass spectrometry

✍ M. Riedel; H. Düsterhöft 📂 Article 📅 1998 🏛 John Wiley and Sons 🌐 English ⚖ 99 KB 👁 1 views

The migration of hydrogen in metals plays an important role in many fields of science and technology. Secondary ion mass spectrometry (SIMS) is a suitable method for analysis of hydrogen in solids, but there are still unsolved problems (sputter enhanced migration, stable reference materials for quan

Surface functionalization of PEEK films

Surface functionalization of PEEK films studied by time-of-flight secondary ion mass spectrometry and x-ray photoelectron spectroscopy

✍ Henneuse-Boxus, Catherine; Poleunis, Claude; De Ro, Astrid; Adriaensen, Yasmine; 📂 Article 📅 1999 🏛 John Wiley and Sons 🌐 English ⚖ 279 KB 👁 1 views

Using the wet chemistry method, the surface of poly(aryl ether ether ketone) (PEEK) Ðlm was selectively modiÐed to produce PEEK-OH, PEEK-COOH, PEEK-glutamine, and samples displaying, PEEK-NH 2 PEEK-SO 3 H respectively, hydroxyl, carboxyl, amino acid, amine and sulphonyl functions. All the samples we

Surface oxidation of styrene butadiene c

Surface oxidation of styrene butadiene copolymers: Study by laser ablation and secondary ion mass spectrometry

✍ D. Ruch; C. Boes; R. Zimmer; H.-N. Migeon; J. F. Muller 📂 Article 📅 2003 🏛 John Wiley and Sons 🌐 English ⚖ 159 KB

Dissociation study of tellurium cluster

Dissociation study of tellurium cluster ions, Ten+ (n = 25-85) using secondary ion mass spectrometry

✍ Ito, Hiroyuki; Matsuo, Takekiyo; Sato, Takaya; Ichiharai, Toshio; Katakuse, Itsu 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 99 KB 👁 1 views

Dissociation pathways of tellurium clusters, Te n Y (n = 25-85), were investigated by secondary ion mass spectrometry. Positively charged ions were generated from a tellurium sheet by bombardment with 10 keV xenon ion beam. Mass analyses of cluster ions were performed using a grand-scale sector mass

Characterization of combinatorially desi

Characterization of combinatorially designed polyarylates by time-of-flight secondary ion mass spectrometry

✍ Anna M. Belu; Stephen Brocchini; Joachim Kohn; Buddy D. Ratner 📂 Article 📅 2000 🏛 John Wiley and Sons 🌐 English ⚖ 114 KB 👁 1 views

A series of 16 polyarylates, with well-controlled and systematically varying chemistry, has been characterized by time-of-flight secondary ion mass spectrometry (TOF-SIMS). The polymers are structurally identical except for the incremental additions of C 2 H 4 units to the backbone and sidechain. Fr