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Hydrogen outgassing of ZrNiCu(H) amorphous alloy studied by secondary ion mass spectrometry

✍ Scribed by M. Riedel; H. Düsterhöft

Publisher
John Wiley and Sons
Year
1998
Tongue
English
Weight
99 KB
Volume
12
Category
Article
ISSN
0951-4198

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✦ Synopsis

The migration of hydrogen in metals plays an important role in many fields of science and technology. Secondary ion mass spectrometry (SIMS) is a suitable method for analysis of hydrogen in solids, but there are still unsolved problems (sputter enhanced migration, stable reference materials for quantification). The complex process of the migration of hydrogen and the secondary H ion emission from a homogeneous solid matrix (Zr 50 Ni 25 Cu 25 amorphous alloy) of high H-concentration (H/Me atomic ratio up to 0.9) was studied. A kinetic model for consecutive diffusion and sputtering-enhanced desorption processes was set up. Sputtering-influenced and long-time (months) experiments were carried out for the study of hydrogen storage and outgassing of amorphous alloys. Rate constants for ion induced desorption and outgassing, and the activation energy for diffusion, were calculated.

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