Dissociation study of tellurium cluster ions, Ten+ (n = 25-85) using secondary ion mass spectrometry
✍ Scribed by Ito, Hiroyuki; Matsuo, Takekiyo; Sato, Takaya; Ichiharai, Toshio; Katakuse, Itsuo
- Publisher
- John Wiley and Sons
- Year
- 2000
- Tongue
- English
- Weight
- 99 KB
- Volume
- 35
- Category
- Article
- ISSN
- 1076-5174
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✦ Synopsis
Dissociation pathways of tellurium clusters, Te n Y (n = 25-85), were investigated by secondary ion mass spectrometry. Positively charged ions were generated from a tellurium sheet by bombardment with 10 keV xenon ion beam. Mass analyses of cluster ions were performed using a grand-scale sector mass spectrometer. In the first field-free region, Te n Y (n = 25-80) had a large dissociation probability with five-and six-atom emission and Te n Y (n = 50-85) had a slightly large dissociation probability with 10-and 11-atom emission. Five-and six-atom dissociation in the second field-free region could be also observed. These results were most likely due to the cluster emission processes for Te n Y , although sequential atom emission and cluster emission could not be distinguished by this type of experiments.