✦ LIBER ✦

Study of trapping phenomenon in 4H-SiC MESFETs: dependence on substrate purity

✍ Scribed by Sghaier, N.; Bluet, J.-M.; Souifi, A.; Guillot, G.; Morvan, E.; Brylinski, C.

Book ID: 114616986
Publisher: IEEE
Year: 2003
Tongue: English
Weight: 326 KB
Volume: 50
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2002.808559

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Influence of 4H-SiC semi-insulating subs

Influence of 4H-SiC semi-insulating substrate purity on SiC metal-semiconductor field-effect transistor performance

✍ A. P. Zhang; L. B. Rowland; E. B. Kaminsky; J. B. Tucker; R. A. Beaupre; J. W. K 📂 Article 📅 2003 🏛 Springer US 🌐 English ⚖ 787 KB

Deep Level Investigation by Current and

Deep Level Investigation by Current and Capacitance Transient Spectroscopy in 4H-SiC MESFETs on Semi-Insulating Substrates

✍ Gassoumi, M.; Sghaier, N.; Dermoul, I.; Chekir, F.; Maaref, H.; Bluet, Jean Mari 📂 Article 📅 2004 🏛 Trans Tech Publications, Ltd. 🌐 English ⚖ 441 KB

Energy- and Time-Dependent Dynamics of T

Energy- and Time-Dependent Dynamics of Trap Occupation in 4H-SiC MOSFETs

✍ Potbhare, S.; Goldsman, N.; Akturk, A.; Gurfinkel, M.; Lelis, A.; Suehle, J.S. 📂 Article 📅 2008 🏛 IEEE 🌐 English ⚖ 839 KB

Comparative Studies of Carrier Dynamics

Comparative Studies of Carrier Dynamics in 3C-SiC Layers Grown on Si and 4H-SiC Substrates

✍ Patrik Ščajev; Jawad Hassan; Kęstutis Jarašiūnas; Masashi Kato; Anne Henry; J. P 📂 Article 📅 2010 🏛 Springer US 🌐 English ⚖ 522 KB

[IEEE 2013 Spanish Conference on Electro

[IEEE 2013 Spanish Conference on Electron Devices (CDE) - Valladolid, Spain (2013.02.12-2013.02.14)] 2013 Spanish Conference on Electron Devices - An improved I-V model of 4H-SiC MESFETs incorporating substrate trapping, surface trapping and thermal effects

✍ Rao, M. Hema Lata; Narasimha Murty, Neti V. L. 📂 Article 📅 2013 🏛 IEEE ⚖ 240 KB

Liquid-phase epitaxy of 2H–SiC film on a

Liquid-phase epitaxy of 2H–SiC film on a (0001) 4H–SiC substrate in Li–Si melt

✍ Mamoru Imade; Takashi Ogura; Masahiro Uemura; Fumio Kawamura; Masashi Yoshimura; 📂 Article 📅 2009 🏛 Elsevier Science 🌐 English ⚖ 767 KB