Deep Level Investigation by Current and Capacitance Transient Spectroscopy in 4H-SiC MESFETs on Semi-Insulating Substrates

✍ Scribed by Gassoumi, M.; Sghaier, N.; Dermoul, I.; Chekir, F.; Maaref, H.; Bluet, Jean Marie; Guillot, Gérard; Morvan, Erwan; Noblanc, Olivier; Dua, Christian; Brylinski, C.

• Book ID: 125421140
• Publisher: Trans Tech Publications, Ltd.
• Year: 2004
• Tongue: English
• Weight: 441 KB
• Volume: 457-460
• Category: Article
• ISSN: 1662-9752
• DOI: 10.4028/www.scientific.net/msf.457-460.1185