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Study of Si+-implanted and annealed InP by means of Raman spectroscopy

✍ Scribed by R. Cuscó; J. Ibáñez; N. Blanco; G. González-Díaz; L. Artús


Book ID
114169476
Publisher
Elsevier Science
Year
1997
Tongue
English
Weight
536 KB
Volume
132
Category
Article
ISSN
0168-583X

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