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Characterization of Cd implanted and annealed GaAs and InP by perturbed angular correlation (PAC) spectroscopy

โœ Scribed by W. Pfeiffer; M. Deicher; R. Keller; R. Magerle; P. Pross; H. Skudlik; Th. Wichert; H. Wolf; D. Forkel; N. Moriya; R. Kalish


Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
358 KB
Volume
50
Category
Article
ISSN
0169-4332

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