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Study of Random-Dopant-Fluctuation (RDF) Effects for the Trigate Bulk MOSFET

✍ Scribed by Changhwan Shin; Xin Sun; Tsu-Jae King Liu

Book ID: 114619643
Publisher: IEEE
Year: 2009
Tongue: English
Weight: 547 KB
Volume: 56
Category: Article
ISSN: 0018-9383
DOI: 10.1109/ted.2009.2020321

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