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Studies of thin strained InAs, AlAs, and AlSb layers by spectroscopic ellipsometry

✍ Scribed by Herzinger, C. M.; Snyder, P. G.; Celii, F. G.; Kao, Y.‐C.; Chow, D.; Johs, B.; Woollam, J. A.

No coin nor oath required. For personal study only.

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