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In Situ Annealing Studies of Sol-Gel Ferroelectric Thin Films by Spectroscopic Ellipsometry

✍ Scribed by Susan Trolier-McKinstry; Jiayu Chen; Kuppuswami Vedam; Robert E. Newnham

Book ID: 110827051
Publisher: John Wiley and Sons
Year: 1995
Tongue: English
Weight: 782 KB
Volume: 78
Category: Article
ISSN: 0002-7820
DOI: 10.1111/j.1151-2916.1995.tb08908.x

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