Spectroscopic ellipsometry studies of Mg
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Yang, Shenghong ;Liu, Ying ;Zhang, Yueli ;Mo, Dang
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Article
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2009
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John Wiley and Sons
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English
β 443 KB
## Abstract Zn~1β__x__~ Mg__~x~__ O (ZMO) thin films with __x__ = 0, 0.1, 0.2, and 0.3 were prepared on Si(100) substrates by the solβgel method. The influence of Mg content on the structural and the optical properties was studied by Xβray diffraction and spectroscopic ellipsometry (SE) in the UVβv