✦ LIBER ✦
Growth mode of ultrathin Sb layers on Si studied by spectroscopic ellipsometry and Raman scattering
✍ Scribed by U. Rossow; U. Frotscher; N. Esser; U. Resch; Th. Müller; W. Richter; D.A. Woolf; R.H. Williams
- Publisher
- Elsevier Science
- Year
- 1993
- Tongue
- English
- Weight
- 269 KB
- Volume
- 63
- Category
- Article
- ISSN
- 0169-4332
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