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Structural properties of Ge/Si(001) nano-islands by diffraction anomalous fine structure and multiwavelength anomalous diffraction

✍ Scribed by M.-I. Richard; N. A. Katcho; M. G. Proietti; H. Renevier; V. Favre-Nicolin; Z. Zhong; G. Chen; M. Stoffel; O. Schmidt; G. Renaud; T. U. Schülli; G. Bauer

Book ID: 111633711
Publisher: Springer-Verlag
Year: 2009
Tongue: English
Weight: 474 KB
Volume: 167
Category: Article
ISSN: 1951-6355
DOI: 10.1140/epjst/e2009-00929-4

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