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Diffraction Anomalous Fine Structure study and atomistic simulation of Ge/Si nanoislands

✍ Scribed by N.A. Katcho; M.-I. Richard; M.G. Proietti; H. Renevier; C. Leclere; V. Favre-Nicolin; J.J. Zhang; G. Bauer

Book ID: 113823629
Publisher: Elsevier Science
Year: 2012
Tongue: English
Weight: 679 KB
Volume: 284
Category: Article
ISSN: 0168-583X
DOI: 10.1016/j.nimb.2011.08.003

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