Atomic scale stresses and strains in Ge/Si(001) nanopixels: An atomistic simulation study

✍ Scribed by Makeev, Maxim A.; Yu, Wenbin; Madhukar, Anupam

• Book ID: 115479612
• Publisher: American Institute of Physics
• Year: 2004
• Tongue: English
• Weight: 626 KB
• Volume: 96
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.1792811